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Scanning Acoustic Tomography (SAT)
 

    The Scanning Acoustic Tomography (SAT), also called Scanning Acoustic Microscope (SAM), is applied to analyze the sample internal situation by a ultrawave piercing through the sample. When the ultrawave pierces through the sample, the computer will gather the reflected untrawave (or the transmitted untrawave for different operation mode) and show the sample internal situation.

    Usually, the SAT/SAM is used to analyze the sample internal de-lamination and cracks. For different purposes, there are several typical SAT operation modes including A-scan, B-scan, C-scan, T-scan, and TAMI.

Our services include:
IC Package Level Structure Analysis
IC Package Quality on PCBA Level
PCB/IC Substrate Structure Analysis
Wafer Level Structure Analysis
WLCSP Structure Analysis




 
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